產(chǎn)品名稱:
差分探頭| TDP0500
更新時(shí)間:2024-09-07
產(chǎn)品型號(hào):TDP0500
產(chǎn)品特點(diǎn):差分探頭| TDP0500 Specifically designed for use with and direct connection to Tektronix oscilloscopes with either the TekVPI™ probe interface, or TekProbe BNC Interface. The TDP1000, TDP0500, and P6251 H
TDP0500差分探頭| TDP0500的詳細(xì)資料:
差分探頭| TDP0500
差分探頭| TDP0500
Features & Benefits
Outstanding Electrical Performance
- 1 GHz and 500 MHz Probe Bandwidth
- <1 pF Differential Input Capacitance
- 1 MΩ Differential Input Resistance
- ±42 V (DC + pk AC) Differential Input Voltage
- >18 dB CMRR (at 250 MHz 50X attenuation)
- Selectable Bandwidth-limiting Filters
- DC Reject
Versatile DUT Connectivity
- Small Compact Probe Head for Probing Small Geometry Circuit Elements
- Straight Pin, Square Pin, Solder Down, Variable Pitch Standard Accessories
- Robust Design for Reliability
Easy to Use
- Provides Automatic Units Scaling and Readout on the Oscilloscope Display
- TDP1000, TDP0500
- Connect Directly to Oscilloscopes with the TekVPI™ Probe Interface
- Easy Access to Scope-displayed Probe Menu for Probe Setup Control and Operating Status Information
- Remote GPIB/USB Probe Control through the Oscilloscope
- AutoZero – Zeros Out Output Offset
- P6251
- Connect Directly to the TekProbe™ Interface Oscilloscopes, or to TekConnect® Oscilloscopes using TCA-BNC Adapter
Applications
- High-speed Switch Mode Power Supply Design
- CAN/LIN Bus Design
- High-speed Digital Design
- Digital Design and Characterization
- Manufacturing Engineering Test
- Research and Development
The TDP1000, TDP0500, and P6251 High-voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today’s Switch Mode Power Supply (SMPS), CAN/LIN Bus, and high-speed digital system designs.
Specifically designed for use with and direct connection to Tektronix oscilloscopes with either the TekVPI™ probe interface, or TekProbe BNC Interface. The TDP1000, TDP0500, and P6251 High-voltage Differential Probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional measurement challenges:
- Outstanding Electrical Performance
- Versatile Device-Under-Test Connectivity
- Ease of Use
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